Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques (1992) (Springer Series in Surface Sciences #28)

By: W. Baumeister and P. Grütter and R. Guckenberger and Hans-Joachim Güntherodt and T. Hartmann and H. Heinzelmann and H. J. Mamin and E. Meyer and D. W. Pohl and D. Rugar and H. Siegenthaler and U. Staufer and H. K. Wickramasinghe and W. Wiegräbe and Roland Wiesendanger

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Synopsis: Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.