On-Line Testing for VLSI (1998) (Frontiers in Electronic Testing #11)
By: and and
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- Synopsis
- Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
- Copyright:
- 1998
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9781475760699
- Related ISBNs:
- 9780792381327
- Publisher:
- Springer US
- Date of Addition:
- 01/26/21
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Michael Nicolaidis
- Edited by:
- Yervant Zorian
- Edited by:
- Dhiraj Pradhan
Reviews
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- by Michael Nicolaidis
- by Yervant Zorian
- by Dhiraj Pradhan
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